Nanostructure characterization by the element sensitive Anomalous small-angle X-ray scattering method

Seminar/Forum

Nanostructure characterization by the element sensitive Anomalous small-angle X-ray scattering method

The Small Angle X-ray Scattering (SAXS) is a non-destructive method for the analysis of nano-structures in a wide variety of materials. This method allows determining averaged structural parameters on a length scale from just above the atomic size up to about 100 nanometre in multicomponent systems. Structural parameters are e.g. size distributions, volume fractions and inner surface sizes. Moreover, Anomalous Small Angle X-ray Scattering (ASAXS) exploits the anomalous dispersion of the scattering amplitudes near the X-ray absorption edges of a particular element in the sample. These element sensitive contrast variations are used to analyse averaged composition fluctuations in nanostructures. This talk will elaborate on the advantages of ASAXS in the analysis of inorganic complex materials. After an introduction into the methods of SAXS and ASAXS some technical and practical details of the ASAXS dedicated instrument at the synchrotron BESSY II will be presented. In the second part some material science applications are chosen to illustrate different aspects and benefits of SAXS and ASAXS in the field of catalysis, energy related materials, and photonics.

Presenter

  • Dr Armin Hoell
    Dr Armin Hoell, Humboldt University Berlin